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speckle-tracking a Software Suite for Ptychographic X-ray Speckle Tracking

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Document pages: 11 pages

Abstract: In recent years, x-ray speckle tracking techniques have emerged as viabletools for wavefront metrology and sample imaging applications. These methodsare based on the measurement of near-field images. Thanks to the simpleexperimental set-up, high angular sensitivity and compatibility with lowcoherence sources these methods have been actively developed for use withsynchrotron and laboratory light sources. Not only do speckle-trackingtechniques give the potential for high resolution imaging, but they alsoprovide rapid and robust characterisation of aberrations of x-ray opticalelements, focal spot profiles and the sample position and transmissionproperties. In order to realise these capabilities, we require softwareimplementations that are equally rapid and robust. To address this need, asoftware suite has been developed for the "ptychographic x-ray speckle trackingtechnique " -- an x-ray speckle based method suitable for highly divergentwavefields. The software suite is written in Python 3, with an OpenCL back endfor GPU and multi-CPU core processing. It is accessible as a Python module,through the command line or through a graphical user interface and is availableas source code under version 3 or later of the GNU General Public License.

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